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Credit Hours: 3 Effective Term: Fall 2017 SUN#: None AGEC: None |
Credit Breakdown: 2 Lectures, 3 Labs Times for Credit: 1 Grading Option: A, B, C, D, F Cross-Listed: |
Measurable Student Learning Outcomes |
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1. (Knowledge Level) Describe the application of the Atomic Force Microscope (AFM).
2. (Comprehension Level) Describe the operation and limitations of the UV-Vis spectophotometer. 3. (Analysis Level) Analyze IR-spectra for identifying bonding of a variety of materials. 4. (Comprehension Level) Describe the operation of Fourier Transform Infrared Spectroscopy (FTIR). 5. (Analysis Level) Analyse FTIR data to identify materials. 6. (Evaluation Level) Describe the operation and evaluate limitations of the scanning electron microscope. 7. (Evaluation Level) Describe the operation and evaluate limitations of Field Emission Electron Microscope (FESEM). 8. (Evaluation Level) Describe the operation and evaluate limitations of the transmission electron microscope (TEM). 9. (Evaluation Level) Describe the operation and evaluate limitations of Secondary Ion Mass Spectrostropy (SIMS). |
Internal/External Standards Accreditation |
Nantechnology Standards: URL: http://www.astm.org/Standards/nanotechnology-standards.html |