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MET 295 Characterization, Testing of Nanotechnology Structures and Materials
Credit Hours:  3
Effective Term: Fall 2017
SUN#: None
AGEC: None  
Credit Breakdown: 2 Lectures, 3 Labs
Times for Credit: 1
Grading Option: A, B, C, D, F
Cross-Listed:


Description: Examine a variety of techniques and measurements essential for testing and controlling material fabrication and final device performance. Characterization includes optical, physical, and electrical approaches. Prerequisite: MET294.

Prerequisites: MET294

Corequisites: None

Recommendations: None

Measurable Student Learning Outcomes
1. (Knowledge Level) Describe the application of the Atomic Force Microscope (AFM).
2. (Comprehension Level) Describe the operation and limitations of the UV-Vis spectophotometer.
3. (Analysis Level) Analyze IR-spectra for identifying bonding of a variety of materials.
4. (Comprehension Level) Describe the operation of Fourier Transform Infrared Spectroscopy (FTIR).
5. (Analysis Level) Analyse FTIR data to identify materials.
6. (Evaluation Level) Describe the operation and evaluate limitations of the scanning electron microscope.
7. (Evaluation Level) Describe the operation and evaluate limitations of Field Emission Electron Microscope (FESEM).
8. (Evaluation Level) Describe the operation and evaluate limitations of the transmission electron microscope (TEM).
9. (Evaluation Level) Describe the operation and evaluate limitations of Secondary Ion Mass Spectrostropy (SIMS).
Internal/External Standards Accreditation
Nantechnology Standards: URL: http://www.astm.org/Standards/nanotechnology-standards.html